On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. - Arthur Ceratti; Thiago Copetti; Letícia Maria Bolzani Poehls; Fabian Vargas 001 (DDECS, 2012)

Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM. - Arthur Ceratti; Thiago Copetti; Letícia Maria Veiras Bolzani; Fabian Vargas 001 (LATW, 2012)

Hierarchical identification of NBTI-critical gates in nanoscale logic. - Sergei Kostin; Jaan Raik; Raimund Ubar; Maksim Jenihhin; Fabian Vargas 001; Letícia Maria Bolzani Poehls; Thiago Santos Copetti (LATW, 2014)

An On-Chip Sensor to Monitor NBTI Effects in SRAMs. - Arthur Ceratti; Thiago Copetti; Letícia Maria Bolzani Poehls; Fabian Vargas 001; Rubem Dutra Ribeiro Fagundes (J. Electron. Test., 2014)

SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic. - Sergei Kostin; Jaan Raik; Raimund Ubar; Maksim Jenihhin; Thiago Copetti; Fabian Vargas 001; Letícia Maria Bolzani Pöhls (DDECS, 2015)

NBTI-aware design of integrated circuits: a hardware-based approach. - Thiago Copetti; G. Cardoso Medeiros; Letícia Maria Bolzani Poehls; Fabian Vargas 001 (LATS, 2015)

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG. - N. Palermo; Valentin Tihhomirov; Thiago Santos Copetti; Maksim Jenihhin; Jaan Raik; Sergei Kostin; Marco Gaudesi; Giovanni Squillero; Matteo Sonza Reorda; Fabian Vargas 001; Letícia Maria Bolzani Pöhls (LATS, 2015)

Gate-level modelling of NBTI-induced delays under process variations. - Thiago Copetti; Guilherme Medeiros Machado; Leticia Bolzani Poehls; Fabian Vargas 001; Sergei Kostin; Maksim Jenihhin; Jaan Raik; Raimund Ubar (LATS, 2016)

Analyzing NBTI impact on SRAMs with resistive-open defects. - M. Tulio Martins; G. Cardoso Medeiros; Thiago Copetti; Fabian Vargas 001; Letícia Maria Bolzani Poehls (LATS, 2016)

NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time. - Thiago Copetti; Guilherme Cardoso Medeiros; Leticia Bolzani Poehls; Fabian Vargas 001 (J. Electron. Test., 2016)

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. - Maksim Jenihhin; Giovanni Squillero; Thiago Santos Copetti; Valentin Tihhomirov; Sergei Kostin; Marco Gaudesi; Fabian Vargas 001; Jaan Raik; Matteo Sonza Reorda; Leticia Bolzani Poehls; Raimund Ubar; Guilherme Cardoso Medeiros (J. Electron. Test., 2016)

Analyzing the behavior of FinFET SRAMs with resistive defects. - Thiago Santos Copetti; Tiago R. Balen; Guilherme Cardoso Medeiros; Letícia Maria Bolzani Poehls (VLSI-SoC, 2017)

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. - Thiago Santos Copetti; Guilherme Cardoso Medeiros; Letícia Maria Bolzani Poehls; Tiago R. Balen (VLSI-SoC (Selected Papers), 2017)

Analysing NBTI Impact on SRAMs with Resistive Defects. - M. Tulio Martins; G. Cardoso Medeiros; Thiago Copetti; Fabian Vargas 001; Marcus Pohls (J. Electron. Test., 2017)

Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. - G. Cardoso Medeiros; E. Brum; Leticia Bolzani Poehls; Thiago Copetti; Tiago R. Balen (LATS, 2018)

A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. - Thiago Santos Copetti; Tiago R. Balen; E. Brum; C. Aquistapace; Leticia Bolzani Poehls (LATS, 2019)

Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. - G. Cardoso Medeiros; E. Brum; Leticia Bolzani Poehls; Thiago Copetti; Tiago R. Balen (J. Electron. Test., 2019)

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. - Thiago Copetti; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Leticia Bolzani Poehls; Tiago R. Balen (LATS, 2020)

Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. - Thiago Copetti; Tiago R. Balen; E. Brum; C. Aquistapace; Leticia Bolzani Poehls (J. Electron. Test., 2020)

Improving the Detection of Undefined State Faults in FinFET SRAMs. - G. Cardoso Medeiros; Moritz Fieback; Thiago Santos Copetti; Anteneh Gebregiorgis; Mottaqiallah Taouil; Leticia B. Poehls; Said Hamdioui (DTIS, 2021)

Evaluating the Impact of Process Variation on RRAMs. - E. Brum; Moritz Fieback; Thiago Santos Copetti; H. Jiayi; Said Hamdioui; Fabian Vargas 001; Letícia Maria Veiras Bolzani (LATS, 2021)

Validating a DFT Strategy's Detection Capability regarding Emerging Faults in RRAMs. - Thiago Santos Copetti; Tobias Gemmeke; Letícia Maria Veiras Bolzani (VLSI-SoC, 2021)

A DfT Strategy for Detecting Emerging Faults in RRAMs. - Thiago Santos Copetti; Tobias Gemmeke; Letícia Maria Bolzani Pöhls (VLSI-SoC (Selected Papers), 2021)

Review of Manufacturing Process Defects and Their Effects on Memristive Devices. - Letícia Maria Veiras Bolzani; Moritz Fieback; Susanne Hoffmann-Eifert; Thiago Copetti; E. Brum; Stephan Menzel; Said Hamdioui; Tobias Gemmeke (J. Electron. Test., 2021)

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. - Thiago Copetti; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Letícia Maria Bolzani Poehls; Tiago Roberto Balen (J. Electron. Test., 2021)

Reliability evaluation of finFET-based SRAMs in the presence of resistive defects - Thiago Santos Copetti (2021)

Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. - Thiago Santos Copetti; M. Nilovic; Moritz Fieback; Tobias Gemmeke; Said Hamdioui; Letícia Maria Bolzani Poehls (LATS, 2022)

Characterization and Test of Intermittent Over RESET in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Hassen Aziza; Mathijs Heidekamp; Thiago Copetti; Letícia Maria Veiras Bolzani Poehls; Mottaqiallah Taouil; Said Hamdioui (ATS, 2023)

Evaluating a New RRAM Manufacturing Test Strategy. - Thiago Santos Copetti; A. Castelnuovo; Tobias Gemmeke; Letícia Maria Veiras Bolzani (LATS, 2023)

Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. - Thiago Copetti; A. Chordia; Moritz Fieback; Mottaqiallah Taouil; Said Hamdioui; Letícia Maria Veiras Bolzani (LATS, 2024)

Understanding Transistor Aging Impact on the Behavior of RRAM Cells. - Seyed Hossein Hashemi Shadmehri; Supriya Chakraborty; Thiago Santos Copetti; Fabian Luis Vargas 001; Letícia Maria Bolzani Poehls (VLSI-SoC, 2024)

A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. - Thiago Santos Copetti; Moritz Fieback; Tobias Gemmeke; Said Hamdioui; Letícia Maria Veiras Bolzani Poehls (J. Electron. Test., 2024)

A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime. - Thiago Santos Copetti; Supriya Chakraborty; Letícia Maria Bolzani Poehls (LATS, 2025)