Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip. - Thibault Kempf; Vincenzo Della Marca; L. Baron; F. Maugain; Francesco La Rosa; Stephan Niel; Arnaud Régnier; Jean-Michel Portal; Pascal Masson (IRPS, 2018)

Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction. - Vincenzo Della Marca; Jérémy Postel-Pellerin; Thibault Kempf; Arnaud Régnier; Philippe Chiquet; Marc Bocquet (Microelectron. Reliab., 2018)

Hot Electron Source Side Injection Comprehension in 40nm eSTM™. - Franck Melul; Thibault Kempf; Vincenzo Della Marca; Marc Bocquet; Madjid Akbal; Frederique Trenteseaux; Marc Mantelli; Arnaud Régnier; Stephan Niel; Francesco La Rosa (IMW, 2021)

40nm SONOS Embedded Select in Trench Memory. - Radouane Habhab; Vincenzo Della Marca; Pascal Masson; Nadia Miridi; Clement Pribat; Simon Jeannot; Thibault Kempf; Marc Mantelli; Philippe Lorenzini; Jean-Marc Voisin; Arnaud Régnier; Stephan Niel; et al. (ESSDERC, 2023)