Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. - Frédéric Darracq; Hervé Lapuyade; Nadine Buard; Pascal Fouillat; R. Dufayel; Thierry Carrière (Microelectron. Reliab., 2003)

A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. - Guillaume Hubert; Nadine Buard; Cécile Weulersse; Thierry Carrière; Marie-Catherine Palau; Jean-Marie Palau; Damien Lambert; Jacques Baggio; Frederic Wrobel; Frédéric Saigné; Rémi Gaillard (IOLTS, 2005)

Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. - Guillaume Hubert; Antonin Bougerol; Florent Miller; Nadine Buard; Lorena Anghel; Thierry Carrière; Frederic Wrobel; Rémi Gaillard (IOLTS, 2006)

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. - Claudia Rusu; Antonin Bougerol; Lorena Anghel; Cécile Weulersse; Nadine Buard; S. Benhammadi; Nicolas Renaud; Guillaume Hubert; Frederic Wrobel; Thierry Carrière; Rémi Gaillard (IOLTS, 2007)

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool. - Cécile Weulersse; Florent Miller; Thierry Carrière; R. Mangeret (Microelectron. Reliab., 2015)