Fully ECL-compatible GaAs standard-cell library. - Guy Schou; Joel Cherel; Ernesto H. Perea; Jean-Yves Danckaert; Thierry Dean; Jean Chaplard (IEEE J. Solid State Circuits, 1988)

Effects of residual stresses on cracking and delamination risks of an avionics MEMS pressure sensor. - Jürgen Auersperg; Christian Collet; Thierry Dean; Dietmar Vogel; Thomas Winkler (Microelectron. Reliab., 2016)

Investigations of the impact of initial stresses on fracture and delamination risks of an avionics MEMS pressure sensor. - Jürgen Auersperg; Ellen Auerswald; Christian Collet; Thierry Dean; Dietmar Vogel; Thomas Winkler; Sven Rzepka (Microelectron. Reliab., 2018)