Distributed electro-thermal model of IGBT chip - Application to top-metal ageing effects in short circuit conditions. - Jeff Moussodji; Thierry Kociniewski; Zoubir Khatir (Microelectron. Reliab., 2013)

μ-Raman spectroscopy for stress analysis in high power silicon devices. - Thierry Kociniewski; Jeff Moussodji; Zoubir Khatir (Microelectron. Reliab., 2014)

Mechanical and thermal stresses characterization maps on cross-sections of forward biased electronic power devices. - Thierry Kociniewski; Zoubir Khatir (IRPS, 2015)

Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions. - Thierry Kociniewski; Jeff Moussodji; Zoubir Khatir (Microelectron. Reliab., 2015)