Operation of power semiconductors under transient thermal conditions: thermal fatigue reliability and mechanical aspects. - Stéphane Forster; Thierry Lequeu; Robert Jérisian (Microelectron. Reliab., 2001)

Influence of the turn-on mechanism on TRIACs' reliability: di/dt thermal fatigue study in Q1 compared to Q2. - Stéphane Moreau; Stéphane Forster; Thierry Lequeu; Robert Jérisian (Microelectron. Reliab., 2002)

Degradation mechanism of power devices under di/dt thermal shocks: turn-on of a TRIAC in Q3. - Stéphane Forster; Thierry Lequeu; Robert Jérisian (Microelectron. Reliab., 2003)

Comparative study of thermal cycling and thermal shocks tests on electronic components reliability. - Stéphane Moreau; Thierry Lequeu; Robert Jérisian (Microelectron. Reliab., 2004)

The Attractiveness of Reversing Teaching Forms - Feedback on an Electrical Engineering Course. - Sébastien Jacques; Thierry Lequeu (Int. J. Eng. Pedagog., 2020)

Remote Knowledge Acquisition and Assessment During the COVID-19 Pandemic. - Sébastien Jacques; Abdeldjalil Ouahabi; Thierry Lequeu (Int. J. Eng. Pedagog., 2020)

Synchronous E-learning in Higher Education during the COVID-19 Pandemic. - Sébastien Jacques; Abdeldjalil Ouahabi; Thierry Lequeu (EDUCON, 2021)