A Functional Approach to Testing Bit-Sliced Microprocessors. - Thirumalai Sridhar; John P. Hayes (IEEE Trans. Computers, 1981)

Design of Easily Testable Bit-Sliced Systems. - Thirumalai Sridhar; John P. Hayes (IEEE Trans. Computers, 1981)

Analysis and Simulation of Parallel Signature Analyzers. - Thirumalai Sridhar; D. S. Ho; Theo J. Powell; Satish M. Thatte (ITC, 1982)

Concurrent Checking of Program Flow in VLSI Processors. - Thirumalai Sridhar; Satish M. Thatte (ITC, 1982)

An Architecture for Testable VLSI Processors. - Satish M. Thatte; D. S. Ho; H.-T. Yuan; Thirumalai Sridhar; Theo J. Powell (ITC, 1982)

Detectable CMOS Faults in Switch-Level Simulation. - Stephen L. Lusky; Thirumalai Sridhar (ITC, 1985)

A New Parallel Test Approach for Large Memories. - Thirumalai Sridhar (IEEE Des. Test, 1986)

FACT-a testability analysis methodology. - Thirumalai Sridhar (ICCAD, 1989)