The Value of Industry Certifications in ITE: Panel Discussion. - Alan Rowland; Thomas Dawkins; James Risler; Thomas Ayers (SIGITE, 2018)

A Stacked CMOS Image Sensor With Array-Parallel ADC Architecture. - Tomohiro Takahashi; Yuichi Kaji; Yasunori Tsukuda; Shinichiro Futami; Katsuhiko Hanzawa; Takahito Yamauchi; Ping Wah Wong; Frederick T. Brady; Phil Holden; Thomas Ayers; Kyohei Mizuta; Susumu Ohki; et al. (IEEE J. Solid State Circuits, 2018)