Fault Model Extension for Diagnosing Custom Cell Fails. - Gilbert Vandling; Thomas Bartenstein (ITC, 1997)

Fault distinguishing pattern generation. - Thomas Bartenstein (ITC, 2000)

Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm. - Thomas Bartenstein; Douglas Heaberlin; Leendert M. Huisman; David Sliwinski (ITC, 2001)

Panel 9 - Diagnostics vs. Failure Analysis. - Thomas Bartenstein (ITC, 2004)

An Economic Analysis and ROI Model for Nanometer Test. - Brion L. Keller; Mick Tegethoff; Thomas Bartenstein; Vivek Chickermane (ITC, 2004)

Use of MISRs for compression and diagnostics. - Brion L. Keller; Thomas Bartenstein (ITC, 2005)

Optimizing Test Data Volume Using Hybrid Compression. - Brion L. Keller; Sandeep Bhatia; Thomas Bartenstein; Brian Foutz; Anis Uzzaman (ATS, 2008)

Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression. - Anis Uzzaman; Brion L. Keller; Brian Foutz; Sandeep Bhatia; Thomas Bartenstein; Masayuki Arai; Kazuhiko Iwasaki (IEICE Trans. Inf. Syst., 2010)

Green streams for data-intensive software. - Thomas Bartenstein; Yu David Liu (ICSE, 2013)

Rate types for stream programs. - Thomas Bartenstein; Yu David Liu (OOPSLA, 2014)