Efficient Signature-Based Fault Diagnosis Using Variable Size Windows. - Thomas Clouqueur; Ozen Ercevik; Kewal K. Saluja; Hiroshi Takahashi (VLSI Design, 2001)

Sensor deployment strategy for target detection. - Thomas Clouqueur; Veradej Phipatanasuphorn; Parameswaran Ramanathan; Kewal K. Saluja (WSNA, 2002)

Sensor Deployment Strategy for Detection of Targets Traversing a Region. - Thomas Clouqueur; Veradej Phipatanasuphorn; Parameswaran Ramanathan; Kewal K. Saluja (Mob. Networks Appl., 2003)

Fault Tolerance in Collaborative Sensor Networks for Target Detection. - Thomas Clouqueur; Kewal K. Saluja; Parameswaran Ramanathan (IEEE Trans. Computers, 2004)

A Class of Linear Space Compactors for Enhanced Diagnostic. - Thomas Clouqueur; Hideo Fujiwara; Kewal K. Saluja (Asian Test Symposium, 2005)

Design and analysis of multiple weight linear compactors of responses containing unknown values. - Thomas Clouqueur; Kamran Zarrineh; Kewal K. Saluja; Hideo Fujiwara (ITC, 2005)

Classification of Sequential Circuits Based on tauk Notation and Its Applications. - Chia Yee Ooi; Thomas Clouqueur; Hideo Fujiwara (IEICE Trans. Inf. Syst., 2005)

Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch. - Yoshiyuki Nakamura; Thomas Clouqueur; Kewal K. Saluja; Hideo Fujiwara (IEICE Trans. Inf. Syst., 2006)

Vulnerability of Surveillance Networks to Faults. - Tai-Lin Chin; Thomas Clouqueur; Parameswaran Ramanathan; Kewal K. Saluja (Int. J. Distributed Sens. Networks, 2006)

Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on tauk-Notation. - Chia Yee Ooi; Thomas Clouqueur; Hideo Fujiwara (IEICE Trans. Inf. Syst., 2007)

Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester. - Yoshiyuki Nakamura; Thomas Clouqueur; Kewal K. Saluja; Hideo Fujiwara (IEEE Trans. Very Large Scale Integr. Syst., 2007)