Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS. - Robert Pawlowski; Joseph Crop; Minki Cho; James W. Tschanz; Vivek De; Thomas Fairbanks; Heather Quinn; Shekhar Borkar; Patrick Yin Chiang (CICC, 2014)