Efficient test response compaction for robust BIST using parity sequences. - Thomas Indlekofer; Michael Schnittger; Sybille Hellebrand (ICCD, 2010)

Diagnostic Test of Robust Circuits. - Alejandro Cook; Sybille Hellebrand; Thomas Indlekofer; Hans-Joachim Wunderlich (Asian Test Symposium, 2011)

FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. - Sybille Hellebrand; Thomas Indlekofer; Matthias Kampmann; Michael A. Kochte; Chang Liu 010; Hans-Joachim Wunderlich (ITC, 2014)

Adaptive Bayesian Diagnosis of Intermittent Faults. - Laura Rodríguez Gómez; Alejandro Cook; Thomas Indlekofer; Sybille Hellebrand; Hans-Joachim Wunderlich (J. Electron. Test., 2014)

Optimized Selection of Frequencies for Faster-Than-at-Speed Test. - Matthias Kampmann; Michael A. Kochte; Eric Schneider; Thomas Indlekofer; Sybille Hellebrand; Hans-Joachim Wunderlich (ATS, 2015)