Comparison of statistical enhancement methods for Monte Carlo semiconductor simulation. - Carl J. Wordelman; Thomas J. T. Kwan; Charles M. Snell (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998)

A Monte Carlo study , of Electron Transport in Strained Si/SiGe Heterostructures. - Mahbub Rashed; Wei-Kai Shih; Srinivas Jallepalli; R. Zaman; Thomas J. T. Kwan; Christine M. Maziar (VLSI Design, 1998)

A maximum likelihood method for linking particle-in-cell and Monte-Carlo transport simulations. - Kevin J. Bowers; Barbara G. Devolder; Lin Yin; Thomas J. T. Kwan (Comput. Phys. Commun., 2004)