Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults. - Walter M. Lindermeir; Thomas J. Vogels; Helmut E. Graeb (DATE, 1998)

Fault Tuples in Diagnosis of Deep-Submicron Circuits. - Ronald D. Blanton; John T. Chen; Rao Desineni; Kumar N. Dwarakanath; Wojciech Maly; Thomas J. Vogels (ITC, 2002)

Deformations of IC Structure in Test and Yield Learning. - Wojciech Maly; Anne E. Gattiker; Thomas Zanon; Thomas J. Vogels; R. D. (Shawn) Blanton; Thomas M. Storey (ITC, 2003)

Progressive Bridge Identification. - Thomas J. Vogels; Wojciech Maly; R. D. (Shawn) Blanton (ITC, 2003)

Effectiveness of I-V Testing in Comparison to IDDq Tests. - Thomas J. Vogels (VTS, 2003)

Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. - Thomas J. Vogels; Thomas Zanon; Rao Desineni; R. D. (Shawn) Blanton; Wojciech Maly; Jason G. Brown; Jeffrey E. Nelson; Y. Fei; X. Huang; Padmini Gopalakrishnan; Mahim Mishra; Vyacheslav Rovner; et al. (ITC, 2004)