Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. - Thomas Jacquet; Grazia Sasso; Anjan Chakravorty; Niccolò Rinaldi; Klaus Aufinger; Thomas Zimmer; Vincenzo d'Alessandro; Cristell Maneux (Microelectron. Reliab., 2015)

Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations. - C. Mukherjee 001; Thomas Jacquet; Thomas Zimmer; Cristell Maneux; Anjan Chakravorty; Josef Boeck; Klaus Aufinger (ESSDERC, 2016)

Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit. - C. Mukherjee 001; Thomas Jacquet; Anjan Chakravorty; Thomas Zimmer; Josef Boeck; Klaus Aufinger; Cristell Maneux (Microelectron. Reliab., 2017)

A Mobile Application to Secure Pedestrians Interacting with Automated Vehicles. - Romain Tessier; Pierre Merdrignac; Thomas Jacquet; Natacha Métayer (INTSYS, 2024)

A Column Generation Heuristic for Multi-depot Electric Bus Scheduling. - Yoann Sabatier Montanaro; Thomas Jacquet; Quentin Cappart; Guy Desaulniers (CPAIOR (2), 2025)