An ESD test reduction method for complex devices. - Dejan M. Maksimovic; Fabrice Blanc; Guido Notermans; Theo Smedes; Thomas Keller 004 (Microelectron. Reliab., 2009)

ESD robust high-voltage active clamps. - Guido Notermans; Olivier Quittard; Anco Heringa; Zeljko Mrcarica; Fabrice Blanc; Hans van Zwol; Theo Smedes; Thomas Keller 004; Peter C. de Jong (Microelectron. Reliab., 2009)