Reading distance degradation mechanisms of near-field RFID devices. - Peter Jacob; Willy Knecht; Albert Kunz; Giovanni Nicoletti; Thomas Lautenschlager; Moreno Mondada; Damien Pachoud (Microelectron. Reliab., 2009)

EAP4EMSIG - Experiment Automation Pipeline for Event-Driven Microscopy to Smart Microfluidic Single-Cells Analysis. - Nils Friederich; Angelo Jovin Yamachui Sitcheu; Annika Nassal; Matthias Pesch; Erenus Yildiz; Maximilian Beichter; Lukas Scholtes; Bahar Akbaba; Thomas Lautenschlager; Oliver Neumann; Dietrich Kohlheyer; Hanno Scharr; et al. (CoRR, 2024)

EAP4EMSIG - Enhancing Event-Driven Microscopy for Microfluidic Single-Cell Analysis. - Nils Friederich; Angelo Jovin Yamachui Sitcheu; Annika Nassal; Erenus Yildiz; Matthias Pesch; Maximilian Beichter; Lukas Scholtes; Bahar Akbaba; Thomas Lautenschlager; Oliver Neumann; Dietrich Kohlheyer; Hanno Scharr; et al. (CoRR, 2025)