Delay test simulation. - Thomas M. Storey; J. W. Barry (DAC, 1977)

CMOS bridging fault detection. - Thomas M. Storey; Wojciech Maly (ITC, 1990)

Stuck Fault and Current Testing Comparison Using CMOS Chip Test. - Thomas M. Storey; Wojciech Maly; John Andrews; Myron Miske (ITC, 1991)

A Test Methodology for VLSI Chips on Silicon. - Thomas M. Storey (ITC, 1993)

A Test Methodology to Support an ASEM MCM Foundry. - Thomas M. Storey; C. Lapihuska; E. Atwood; L. Su (ITC, 1994)

A Test Methodology for High Performance MCMs. - Thomas M. Storey; Bruce McWilliam (J. Electron. Test., 1997)

Deformations of IC Structure in Test and Yield Learning. - Wojciech Maly; Anne E. Gattiker; Thomas Zanon; Thomas J. Vogels; R. D. (Shawn) Blanton; Thomas M. Storey (ITC, 2003)

Testing in a high volume DSM Environment. - Thomas M. Storey (ITC, 2004)