Comparison of metal gate electrodes on MOCVD HfO2. - Max Christian Lemme; J. K. Efavi; H. D. B. Gottlob; Thomas Mollenhauer; Thorsten Wahlbrink; Heinrich Kurz (Microelectron. Reliab., 2005)

PECVD grown Ge nanocrystals embedded in SiO2: From disordered to templated self-organization. - Robby Peibst; T. Dürkop; Eberhard Bugiel; Namil Koo; Thomas Mollenhauer; Max Christian Lemme; Heinrich Kurz; Karl R. Hofmann (Microelectron. J., 2009)