On-chip evaluation, compensation and storage of scan diagnosis data. - Frank Poehl; Matthias Beck; Ralf Arnold; Jan Rzeha; Thomas Rabenalt; Michael Gössel (IET Comput. Digit. Tech., 2007)

Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. - Frank-Uwe Faber; Matthias Beck; Markus Rudack; Olivier Barondeau; Thomas Rabenalt; Michael Gössel; Andreas Leininger (ETS, 2009)

High Performance Compaction for Test Responses with Many Unknowns. - Thomas Rabenalt; Michael Richter 002; Michael Gössel (Asian Test Symposium, 2010)

Masking of X-Values by Use of a Hierarchically Configurable Register. - Thomas Rabenalt; Michael Gössel; Andreas Leininger (J. Electron. Test., 2011)

Datenkompaktierung für Diagnose und Test. - Thomas Rabenalt (2011)

Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. - Thomas Rabenalt; Michael Richter 002; Frank Poehl; Michael Gössel (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Robustness in automotive electronics: An industrial overview of major concerns. - Ulrich Backhausen; Oscar Ballan; Paolo Bernardi; Sergio de Luca; Julie Henzler; Thomas Kern; Davide Piumatti; Thomas Rabenalt; Krishnapriya Chakiat Ramamoorthy; Ernesto Sánchez 001; Alessandro Sansonetti; Rudolf Ullmann; et al. (IOLTS, 2017)