Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment. - Thomas Santini; Sébastien Morand; Mitra Fouladirad; Luong-Viêt Phung; Florent Miller; Bruno Foucher; Antoine Grall; Bruno Allard (Microelectron. Reliab., 2014)

Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability. - Thomas Santini; Sébastien Morand; Mitra Fouladirad; Florent Miller; Antoine Grall; Bruno Allard (Microelectron. Reliab., 2017)