Operating Temperature Based Vulnerabilities in ReRAM. - Thomas Schultz 004; Rashmi Jha (MWSCAS, 2019)

Vulnerabilities and Reliability of ReRAM Based PUFs and Memory Logic. - Thomas Schultz 004; Rashmi Jha; Matthew J. Casto; Brian Dupaix (IEEE Trans. Reliab., 2020)

ARIA: Additive ReRAM-Based Integrity and Aging Monitoring for ICs. - Thomas Schultz 004; Rashmi Jha; Brian Dupaix; Matthew J. Casto (IEEE Access, 2025)