Ultra-thick gate oxides: charge generation and its impact on reliability. - Udo Schwalke; Martin Pölzl; Thomas Sekinger; Martin Kerber (Microelectron. Reliab., 2001)

Strategic Considerations for Unipolar SiC Switch Options: JFET vs. MOSFET. - Michael Treu; Roland Rupp; P. Blaschitz; K. Rüschenschmidt; Thomas Sekinger; Peter Friedrichs; Rudolf Elpelt; D. Peters (IAS, 2007)