Soft-defect detection (SDD) technique for a high-reliability CMOS SRAM. - Clinton Kuo; Thomas Toms; Bruce T. Neel; Joe Jelemensky; Ernest A. Carter; Philip Smith (IEEE J. Solid State Circuits, 1990)

A 512-kb flash EEPROM embedded in a 32-b microcontroller. - Clinton Kuo; Mark Weidner; Thomas Toms; Henry Choe; Ko-Min Chang; Ann Hanvood; Joseph Jelemensky; Philip Smith (IEEE J. Solid State Circuits, 1992)

Reliability aware through silicon via planning for 3D stacked ICs. - Amirali Shayan Arani; Xiang Hu; He Peng; Chung-Kuan Cheng; Wenjian Yu; Mikhail Popovich; Thomas Toms; Xiaoming Chen (DATE, 2009)

Enabling power distribution network analysis flows for 3D ICs. - Xiang Hu; Thomas Toms; Riko Radojcic; Matt Nowak; Nick Yu; Chung-Kuan Cheng (3DIC, 2010)

Power delivery network design and optimization for 3D stacked die designs. - Pratyush Singh; R. Sankar; Xiang Hu; Weize Xie; Aveek Sarkar; Thomas Toms (3DIC, 2010)

Power and signal integrity challenges in 3D systems. - Miguel Corbalan; Anup Keval; Thomas Toms; Durodami Lisk; Riko Radojcic; Matt Nowak (DAC, 2013)