Observation and characterization of defects in HfO2 high-K gate dielectric layers. - Vidya Kaushik; Martine Claes; Annelies Delabie; Sven Van Elshocht; Olivier Richard; Thierry Conard; Erika Rohr; Thomas Witters; Matty Caymax; Stefan De Gendt (Microelectron. Reliab., 2005)

Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability. - Taras Ravsher; Shamin H. Sharifi; Andrea Fantini; Hubert Hody; Thomas Witters; Daniele Garbin; Robin Degraeve; Valeri Afanas'ev; Jan Van Houdt; Ludovic Goux; D. Crotti; Gouri Sankar Kar (IMW, 2021)

Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors. - Taras Ravsher; Andrea Fantini; Adrian Vaisman Chasin; Shamin H. Sharifi; Hubert Hody; Harold Dekkers; Thomas Witters; Jan Van Houdt; Valeri Afanas'ev; Sebastien Couet; Gouri Sankar Kar (IRPS, 2022)