Deformations of IC Structure in Test and Yield Learning. - Wojciech Maly; Anne E. Gattiker; Thomas Zanon; Thomas J. Vogels; R. D. (Shawn) Blanton; Thomas M. Storey (ITC, 2003)

Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. - Thomas J. Vogels; Thomas Zanon; Rao Desineni; R. D. (Shawn) Blanton; Wojciech Maly; Jason G. Brown; Jeffrey E. Nelson; Y. Fei; X. Huang; Padmini Gopalakrishnan; Mahim Mishra; Vyacheslav Rovner; et al. (ITC, 2004)

Observation of Raman-Ramsey fringes with optical CPT pulses. - Thomas Zanon; Stéphane Tremine; Stéphane Guérandel; Emeric de Clercq; David Holleville; Noël Dimarcq; André Clairon (IEEE Trans. Instrum. Meas., 2005)

Extraction of defect density and size distributions from wafer sort test results. - Jeffrey E. Nelson; Thomas Zanon; Rao Desineni; Jason G. Brown; N. Patil; Wojciech Maly; R. D. (Shawn) Blanton (DATE, 2006)

Extracting Defect Density and Size Distributions from Product ICs. - Jeffrey E. Nelson; Thomas Zanon; Jason G. Brown; Osei Poku; R. D. (Shawn) Blanton; Wojciech Maly; Brady Benware; Chris Schuermyer (IEEE Des. Test Comput., 2006)

Raman-Ramsey Interaction for Coherent Population Trapping Cs Clock. - Stéphane Guérandel; Thomas Zanon; N. Castagna; F. Dahes; Emeric de Clercq; Noël Dimarcq; André Clairon (IEEE Trans. Instrum. Meas., 2007)

STDF Memory Fail Datalog Standard. - Ajay Khoche; Jay Katz; Sauro Landini; Kochen Liao; Neetu Agrawal; Glenn Plowman; Songlin Zuo; Liyang Lai; John Rowe; Thomas Zanon (VTS, 2009)