A World-Wide-Web based instrumentation pool real testing in a virtual world. - Thomas Zimmer; Patrice Kadionik; Yves Danto (MSE, 1997)

Hierarchical Analogue Design and Behavioural Modelling. - Thomas Zimmer; Noëlle Milet-Lewis; Ahmed Fakhfakh; B. Ardouin; Hervé Levi; J. B. Duluc; Pascal Fouillat (MSE, 1999)

On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise. - Brice Grandchamp; Cristell Maneux; Nathalie Labat; André Touboul; Thomas Zimmer (Microelectron. Reliab., 2004)

Representation of the SiGe HBT's thermal impedance by linear and recursive networks. - Hassène Mnif; Thomas Zimmer; Jean Luc Battaglia; Sébastien Fregonese (Microelectron. Reliab., 2004)

An Analog Circuit Fault Characterization Methodology. - Yvan Maidon; Thomas Zimmer; André Ivanov (J. Electron. Test., 2005)

A remote laboratory for electrical engineering education. - Didier Geoffroy; Thomas Zimmer; Michel Billaud (Int. J. Online Eng., 2006)

Integration of remote lab exercises into standard course packages. - Thomas Zimmer; Michel Billaud; Didier Geoffroy (Int. J. Online Eng., 2007)

CNTFET Modeling and Reconfigurable Logic-Circuit Design. - Ian O'Connor; Junchen Liu; Frédéric Gaffiot; Fabien Prégaldiny; Christophe Lallement; Cristell Maneux; Johnny Goguet; Sébastien Fregonese; Thomas Zimmer; Lorena Anghel; Trong-Trinh Dang; Régis Leveugle (IEEE Trans. Circuits Syst. I Regul. Pap., 2007)

A Distance Measurement Platform Dedicated to Electrical Engineering. - Noëlle Lewis; Michel Billaud; Didier Geoffroy; Philippe Cazenave; Thomas Zimmer (IEEE Trans. Learn. Technol., 2009)

From nanoscale technology scenarios to compact device models for ambipolar devices. - Sébastien Fregonese; Cristell Maneux; Thomas Zimmer (ICECS, 2010)

High Level Power and Energy Exploration Using ArchC. - Tushar Gupta; Clement Bertolini; Olivier Héron; Nicolas Ventroux; Thomas Zimmer; François Marc (SBAC-PAD, 2010)

Thermal aging model of InP/InGaAs/InP DHBT. - Sudip Ghosh 002; François Marc; Cristell Maneux; Brice Grandchamp; G. A. Koné; Thomas Zimmer (Microelectron. Reliab., 2010)

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Jean Godin (Microelectron. Reliab., 2010)

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. - Sudip Ghosh 002; Brice Grandchamp; G. A. Koné; François Marc; Cristell Maneux; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean-Yves Dupuy; Jean Godin (Microelectron. Reliab., 2011)

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean Godin (Microelectron. Reliab., 2011)

Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices. - Si-Yu Liao; Jean-Marie Retrouvey; Guillaume Agnus; Weisheng Zhao; Cristell Maneux; Sébastien Fregonese; Thomas Zimmer; Djaafar Chabi; Arianna Filoramo; Vincent Derycke; Christian Gamrat; Jacques-Olivier Klein (IEEE Trans. Circuits Syst. I Regul. Pap., 2011)

Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz. - Mario Weis; Sébastien Fregonese; Marco Santorelli; Amit Kumar Sahoo; Cristell Maneux; Thomas Zimmer (ESSDERC, 2012)

Impact of Power Consumption and Temperature on Processor Lifetime Reliability. - Tushar Gupta; Clement Bertolini; Olivier Héron; Nicolas Ventroux; Thomas Zimmer; François Marc (J. Low Power Electron., 2012)

Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation. - C. Mukherjee 001; Sébastien Fregonese; Thomas Zimmer; Cristell Maneux; Henri Happy; David Mele (ESSDERC, 2014)

Evaluation Plan and Preliminary Evaluation of a Network of Remote Labs in the Maghrebian Countries. - Thrasyvoulos Tsiatsos; Stella Douka; Apostolos Mavridis; Stergios Tegos; Ahmed Naddami; Thomas Zimmer; Didier Geoffroy (Int. J. Online Eng., 2014)

TEMPUS Project eSience. - Thomas Zimmer (Int. J. Online Eng., 2014)

A new physics-based compact model for Bilayer Graphene Field-Effect Transistors. - Jorgue Daniel Aguirre Morales; Sébastien Fregonese; C. Mukherjee 001; Cristell Maneux; Thomas Zimmer (ESSDERC, 2015)

Characterization and modeling of low-frequency noise in CVD-grown graphene FETs. - C. Mukherjee 001; Jorgue Daniel Aguirre Morales; Sébastien Fregonese; Thomas Zimmer; Cristell Maneux; Henri Happy; Wei Wei (ESSDERC, 2015)

HeliosLab: A remote photovoltaic laboratory. - Thomas Zimmer; Michel Billaud; Emmanouil D. Fylladitakis; Petros J. Axaopoulos (exp.at, 2015)

Graphene FET evaluation for RF and mmWave circuit applications. - Sébastien Fregonese; Jorgue Daniel Aguirre Morales; Magali De Matos; Cristell Maneux; Thomas Zimmer (ISCAS, 2015)

Substrate-coupling effect in BiCMOS technology for millimeter wave applications. - Sébastien Fregonese; Rosario D'Esposito; Magali De Matos; Andreas Kohler; Cristell Maneux; Thomas Zimmer (NEWCAS, 2015)

From the eScience Project Chair. - Thomas Zimmer (Int. J. Interact. Mob. Technol., 2015)

Remote Lab Experiments in Electronics for Use and Reuse. - Thomas Zimmer; Michel Billaud; M. Pic; Didier Geoffroy (Int. J. Interact. Mob. Technol., 2015)

Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. - Thomas Jacquet; Grazia Sasso; Anjan Chakravorty; Niccolò Rinaldi; Klaus Aufinger; Thomas Zimmer; Vincenzo d'Alessandro; Cristell Maneux (Microelectron. Reliab., 2015)

Physics-based electrical compact model for monolayer Graphene FETs. - Jorgue Daniel Aguirre Morales; Sébastien Fregonese; C. Mukherjee 001; Cristell Maneux; Thomas Zimmer; Wei Wei; Henri Happy (ESSDERC, 2016)

Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations. - C. Mukherjee 001; Thomas Jacquet; Thomas Zimmer; Cristell Maneux; Anjan Chakravorty; Josef Boeck; Klaus Aufinger (ESSDERC, 2016)

A two-step de-embedding method valid up to 110 GHz. - J. Bazzi; H. Kassem; Arnaud Curutchet; Franck Pourchon; N. Derrier; Didier Céli; Thomas Zimmer (ICM, 2017)

Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit. - C. Mukherjee 001; Thomas Jacquet; Anjan Chakravorty; Thomas Zimmer; Josef Boeck; Klaus Aufinger; Cristell Maneux (Microelectron. Reliab., 2017)

Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications. - Pascal Chevalier 002; Michael Schröter; Colombo R. Bolognesi; Vincenzo d'Alessandro; Maria Alexandrova; Josef Böck; Ralf Flickiger; Sébastien Fregonese; Bernd Heinemann; Christoph Jungemann; Rickard Lovblom; Cristell Maneux; et al. (Proc. IEEE, 2017)

2D RF Electronics: from devices to circuits - challenges and applications. - D. Fadi; Wei Wei; Emiliano Pallecchi; M. Anderson; J. Stake; Marina Deng; Sébastien Fregonese; Thomas Zimmer; Henri Happy (DRC, 2018)

A 128-pixel 0.56THz sensing array for real-time near-field imaging in 0.13μm SiGe BiCMOS. - Philipp Hillger; Ritesh Jain; Janusz Grzyb; Laven Mavarani; Bernd Heinemann; Gaetan MacGrogan; Patrick Mounaix; Thomas Zimmer; Ullrich R. Pfeiffer (ISSCC, 2018)

A 128-Pixel System-on-a-Chip for Real-Time Super-Resolution Terahertz Near-Field Imaging. - Philipp Hillger; Ritesh Jain; Janusz Grzyb; Wolfgang Forster; Bernd Heinemann; Gaetan MacGrogan; Patrick Mounaix; Thomas Zimmer; Ullrich R. Pfeiffer (IEEE J. Solid State Circuits, 2018)

Measurement based accurate definition of the SOA edges for SiGe HBTs. - Mathieu Jaoul; Didier Céli; Cristell Maneux; Thomas Zimmer (BCICTS, 2019)

TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range. - Soumya Ranjan Panda; Sébastien Fregonese; Anjan Chakravorty; Thomas Zimmer (BCICTS, 2019)

Collector-substrate modeling of SiGe HBTs up to THz range. - Bishwadeep Saha; Sébastien Frégonese; Soumya Ranjan Panda; Anjan Chakravorty; Didier Céli; Thomas Zimmer (BCICTS, 2019)

Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance. - Sébastien Fregonese; Chhandak Mukherjee; Holger Rücker; Pascal Chevalier 002; Gerhard Fischer; Didier Céli; Marina Deng; Marine Couret; François Marc; Cristell Maneux; Thomas Zimmer (BCICTS, 2021)

Electro-Thermal Investigation of SiGe HBTs: A Review. - Thomas Zimmer; Sébastien Fregonese; Anjan Chakravorty (BCICTS, 2023)

A Versatile 55-nm SiGe BiCMOS Technology for Wired, Wireless, and Satcom Applications. - Pascal Chevalier 002; Florian Cacho; C. Durand; N. Derrier; V. Millon; Frederic Monsieur; A. Gauthier; P. Billy; Sébastien Fregonese; Thomas Zimmer; H. Audouin; Michel Buczko; et al. (BCICTS, 2024)

On the Safe Operating Area of InP HBTs. - Markus Müller; Sébastien Fregonese; Christoph Weimer; Guangsheng Liang; Xiaodi Jin; Maximilian Froitzheim; Thomas Zimmer; Michael Schröter (BCICTS, 2024)