Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. - Thorsten Oeder; Alberto Castellazzi; Martin Pfost (Microelectron. Reliab., 2017)

Single pulse short-circuit robustness and repetitive stress aging of GaN GITs. - Alberto Castellazzi; Asad Fayyaz; Siwei Zhu; Thorsten Oeder; Martin Pfost (IRPS, 2018)