Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. - Tiago R. Balen; Antonio Andrade Jr.; Florence Azaïs; Michel Renovell; Marcelo Lubaszewski (ITC, 2004)

An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. - Tiago R. Balen; Antonio Andrade Jr.; Florence Azaïs; Marcelo Lubaszewski; Michel Renovell (VTS, 2004)

Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. - Gustavo Pereira; Antonio Andrade Jr.; Tiago R. Balen; Marcelo Lubaszewski; Florence Azaïs; Michel Renovell (VTS, 2005)

Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. - Tiago R. Balen; Antonio Q. Andrade; Florence Azaïs; Marcelo Lubaszewski; Michel Renovell (J. Electron. Test., 2005)

Built-in self-test of global interconnects of field programmable analog arrays. - Antonio Andrade Jr.; Gustavo Vieira; Tiago R. Balen; Marcelo Lubaszewski; Florence Azaïs; Michel Renovell (Microelectron. J., 2005)

Functional Test of Field Programmable Analog Arrays. - Tiago R. Balen; José Vicente Calvano; Marcelo Lubaszewski; Michel Renovell (VTS, 2006)

Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. - Tiago R. Balen; Fernanda Lima Kastensmidt; Marcelo Lubaszewski; Michel Renovell (ISVLSI, 2007)

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. - Tiago R. Balen; José Vicente Calvano; Marcelo Lubaszewski; Michel Renovell (J. Electron. Test., 2007)

Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. - Franco Leite; Tiago R. Balen; Marcos Hervé; Marcelo Lubaszewski; Gilson I. Wirth (LATW, 2009)

Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. - Gabriel de M. Borges; Luiz Fernando Gonçalves; Tiago R. Balen; Marcelo Lubaszewski (ETS, 2010)

Radiation effects on programmable analog devices and mitigation techniques. - Tiago R. Balen; Marcelo Lubaszewski (IOLTS, 2010)

Diversity TMR: Proof of concept in a mixed-signal case. - Gabriel de M. Borges; Luiz Fernando Gonçalves; Tiago R. Balen; Marcelo Lubaszewski (LATW, 2010)

Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. - Gabriel de M. Borges; Luiz Fernando Gonçalves; Tiago R. Balen; Marcelo Lubaszewski (SBCCI, 2010)

Investigating the effects of transient faults in Programmable Capacitor Arrays. - Tiago R. Balen; Guilherme Schwanke Cardoso; Odair Lelis Gonçalez; Marcelo Soares Lubaszewski (LATW, 2011)

Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps. - Luiz Fernando Gonçalves; Jefferson Luiz Bosa; Tiago Roberto Balen; Marcelo Lubaszewski; Eduardo Luis Schneider; Renato V. B. Henriques (J. Electron. Test., 2011)

Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. - Guilherme Schwanke Cardoso; Tiago R. Balen; Marcelo Soares Lubaszewski; Rafael Galhardo Vaz; Odair Lelis Goncalez (LATW, 2012)

Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. - Lucas A. Tambara; Fernanda Lima Kastensmidt; Paolo Rech; Tiago R. Balen; Marcelo Lubaszewski (ISVLSI, 2013)

Design diversity redundancy with spatial-temporal voting applied to data acquisition systems. - Cristiano P. Chenet; Alisson J. C. Lanot; Tiago R. Balen (LATW, 2014)

Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution. - Alisson J. C. Lanot; Tiago R. Balen (LATW, 2014)

Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects. - Alisson J. C. Lanot; Tiago R. Balen (SBCCI, 2014)

Testing fully differential amplifiers using common mode feedback circuit: A case study. - Isis D. Bender; Guilherme Schwanke Cardoso; Arthur C. de Oliveira; Lucas C. Severo; Alessandro Girardi; Tiago R. Balen (LASCAS, 2015)

Exploring design diversity redundancy to improve resilience in mixed-signal systems. - Cristiano P. Chenet; Lucas A. Tambara; Gabriel de M. Borges; Fernanda Lima Kastensmidt; Marcelo Soares Lubaszewski; Tiago R. Balen (Microelectron. Reliab., 2015)

Study of layout extraction accuracy on W/L estimation of ELT in analog design flow. - Guilherme Schwanke Cardoso; Tiago R. Balen (LASCAS, 2016)

Performance evaluation of radiation hardened analog circuits based on Enclosed Layout geometry. - Guilherme Schwanke Cardoso; Tiago R. Balen (LATS, 2016)

Radiation Effects in Low Power and Ultra-Low Power Voltage References. - Daniel Fusco; Tiago R. Balen (J. Low Power Electron., 2016)

Low cost automatic test vector generation for structural analog testing. - André Lucas Chinazzo; Paulo César Comassetto de Aguirre; Tiago R. Balen (LATS, 2017)

Evaluation of a mixed-signal design diversity system under radiation effects. - Carlos J. González; Cristiano P. Chenet; Matheus Budelon; Rafael Galhardo Vaz; Odair Lelis Goncalez; Tiago R. Balen (LATS, 2017)

Analyzing the behavior of FinFET SRAMs with resistive defects. - Thiago Santos Copetti; Tiago R. Balen; Guilherme Cardoso Medeiros; Letícia Maria Bolzani Poehls (VLSI-SoC, 2017)

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. - Thiago Santos Copetti; Guilherme Cardoso Medeiros; Letícia Maria Bolzani Poehls; Tiago R. Balen (VLSI-SoC (Selected Papers), 2017)

Single event transient effects on charge redistribution SAR ADCs. - Thales E. Becker; Alisson J. C. Lanot; Guilherme Schwanke Cardoso; Tiago R. Balen (Microelectron. Reliab., 2017)

Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. - G. Cardoso Medeiros; E. Brum; Leticia Bolzani Poehls; Thiago Copetti; Tiago R. Balen (LATS, 2018)

A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. - Thiago Santos Copetti; Tiago R. Balen; E. Brum; C. Aquistapace; Leticia Bolzani Poehls (LATS, 2019)

Electromagnetic Immunity Test of Analog-to-Digital Interfaces of a Mixed-Signal Programmable SoC. - Luiz G. S. Dias; Carlos J. González; Fernando J. Boeira; Tiago R. Balen (LATS, 2019)

Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. - G. Cardoso Medeiros; E. Brum; Leticia Bolzani Poehls; Thiago Copetti; Tiago R. Balen (J. Electron. Test., 2019)

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. - Thiago Copetti; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Leticia Bolzani Poehls; Tiago R. Balen (LATS, 2020)

Influence of sampling frequency on TID response of SAR ADCs. - Bruno L. Costa; Carlos J. González; Rafael Galhardo Vaz; Odair Lelis Gonçalez; Tiago R. Balen (LATS, 2020)

Low-Voltage Dynamic Comparator with Bulk-Driven Floating Inverter Amplifier. - Bruno Canal; Hamilton Duarte Klimach; Sergio Bampi; Tiago R. Balen (SBCCI, 2020)

Characterization of Enclosed Layout Transistors for Analog Applications on a130nm Technology. - Gustavo Paz Platcheck; Guilherme Schwanke Cardoso; Tiago R. Balen (SBCCI, 2020)

Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. - Thiago Copetti; Tiago R. Balen; E. Brum; C. Aquistapace; Leticia Bolzani Poehls (J. Electron. Test., 2020)

Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators. - Leonardo Bisch Piccoli; Renato V. B. Henriques; Tiago R. Balen (J. Electron. Test., 2020)

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. - Tiago R. Balen; Carlos J. González; Ingrid F. V. Oliveira; Rafael B. Schvittz; Nemitala Added; Eduardo L. A. Macchione; Vitor A. P. de Aguiar; Marcilei Aparecida Guazzelli; Nilberto H. Medina; Paulo F. Butzen (LATS, 2021)

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. - Thiago Copetti; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Letícia Maria Bolzani Poehls; Tiago Roberto Balen (J. Electron. Test., 2021)

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. - Carlos J. González; Bruno L. Costa; Diego N. Machado; Rafael Galhardo Vaz; Alexis C. Vilas Bôas; Odair Lelis Gonçalez; Helmut Puchner; Fernanda Lima Kastensmidt; Nilberto H. Medina; Marcilei Aparecida Guazzelli; Tiago Roberto Balen (J. Electron. Test., 2021)

Hybrid Comparator and Window Switching Scheme for low-power SAR ADC. - Bruno Canal; Hamilton Klimach; Sergio Bampi; Tiago R. Balen (LASCAS, 2022)

Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. - Clayton R. Farias; Rafael B. Schvittz; Tiago R. Balen; Paulo F. Butzen (LATS, 2022)

Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. - Lucas B. Zilch; Állan G. Ferreira; Marcelo Soares Lubaszewski; Tiago R. Balen (LATS, 2022)

Time Assisted SAR ADC with Bit-guess and Digital Error Correction. - Bruno Canal; Hamilton Duarte Klimach; Sergio Bampi; Tiago R. Balen (SBCCI, 2022)

Designing a 9.3μW Low-Power Time-to-Digital Converter (TDC) for a Time Assisted SAR ADC. - Rodrigo N. Wuerdig; Bruno Canal; Tiago R. Balen; Sergio Bampi (SBCCI, 2022)

Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. - Állan G. Ferreira; Lucas B. Zilch; Vinícius Navarro; Marcelo Soares Lubaszewski; Tiago R. Balen (SBCCI, 2023)

Pseudosymmetric Enclosed Layout Transistors for Radiation Hardened Analog Applications. - Gustavo Paz Platcheck; Guilherme Schwanke Cardoso; Tiago Roberto Balen (IEEE Trans. Aerosp. Electron. Syst., 2023)

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. - Tiago R. Balen; Carlos J. González; Ingrid F. V. Oliveira; Leomar S. da Rosa Jr.; Rafael Iankowski Soares; Rafael B. Schvittz; Nemitala Added; Eduardo L. A. Macchione; Vitor A. P. Aguiar; Marcilei Aparecida Guazzelli; Nilberto H. Medina; Paulo F. Butzen (J. Electron. Test., 2023)

Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation. - Clayton R. Farias; Tiago R. Balen; Paulo F. Butzen (LATS, 2024)

Behavioral and Variability Analysis of Enclosed Layout Transistors for Radiation Hardened Analog Circuits. - Gustavo Paz Platcheck; Guilherme Schwanke Cardoso; Tiago R. Balen (LATS, 2024)

Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning. - Állan G. Ferreira; Lucas B. Zilch; Marcelo Soares Lubaszewski; Tiago R. Balen (IEEE Des. Test, 2025)