Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator. - Shaofeng Guo; Runsheng Wang; Zhuoqing Yu; Peng Hao; Pengpeng Ren; Yangyuan Wang; Siyu Liao; Chunyi Huang; Tianlei Guo; Alvin Chen; Jushan Xie; Ru Huang 001 (ICCAD, 2017)