Overshoot stress impact on HfO2 high-κ layer dynamic SILC. - Guangxing Wan; Tianli Duan; Shuxiang Zhang; Lingli Jiang; Bo Tang; Chao Zhao 004; Huilong Zhu; Hongyu Yu (ASICON, 2015)

Investigating the impact of the defect dynamic characteristics on the PBTI in the high-κ gate device. - Xianqiang Liu; Xiaodi Xu; Chenjie Gu; Renyuan Gu; Weiwei Wang; Wenjun Liu; Tianli Duan (Microelectron. Reliab., 2018)