Planning Repeated Degradation Testing for Products With Three-Source Variability. - Zhengxin Zhang; Xiao-Sheng Si; Chang-Hua Hu; Qi Zhang 035; Tian-Mei Li 001; Cong-Qi Xu (IEEE Trans. Reliab., 2016)

A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function. - Chenxu Zhao; Krishna R. Pattipati; Guanjun Liu; Jing Qiu; Kehong Lv; Tianmei Li 001 (IEEE Trans. Syst. Man Cybern. Syst., 2016)

An Integrated Reliability Estimation Approach With Stochastic Filtering and Degradation Modeling for Phased-Mission Systems. - Xiao-Sheng Si; Chang-Hua Hu; Qi Zhang 035; Tian-Mei Li 001 (IEEE Trans. Cybern., 2017)

An Optimal Condition-Based Replacement Method for Systems With Observed Degradation Signals. - Xiaosheng Si; Tianmei Li 001; Qi Zhang 035; Xiaoxiang Hu (IEEE Trans. Reliab., 2018)

A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements. - Xiaosheng Si; Tianmei Li 001; Qi Zhang 035 (IEEE Trans. Reliab., 2019)

A Sequential Bayesian Updated Wiener Process Model for Remaining Useful Life Prediction. - Tianmei Li 001; Hong Pei; Zhenan Pang; Xiaosheng Si; Jian-Fei Zheng (IEEE Access, 2020)

NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction. - Tianmei Li 001; Xiaosheng Si; Zonghao Yang; Hong Pei; Yuzhe Ma (IEEE Access, 2020)

An Adaptive Maintenance Policy With Nonlinear Degradation Modeling Based on Prognostic Information. - Jian-Fei Zheng; Hanxiao Mu; Xuanjun Wang; Tian-Mei Li 001; Qi Zhang 035; Xi Wang (IEEE Access, 2020)

Prognostics for Linear Stochastic Degrading Systems With Survival Measurements. - Xiaosheng Si; Tian-Mei Li 001; Qi Zhang 035; Changhua Hu (IEEE Trans. Ind. Electron., 2020)

Sneak circuit analysis considering component performance degradation under digital twin model. - Yuzhe Ma; Tianmei Li 001; Xiaosheng Si; Changhua Hu; Shengfei Zhang; Hao Zhang (CAA SAFEPROCESS, 2021)

A New Missing Data Generation Method Based on An Improved DCGAN With Application to RUL Prediction. - Shengfei Zhang; Tianmei Li 001; Xiaosheng Si; Changhua Hu; Hao Zhang; Yuzhe Ma (CAA SAFEPROCESS, 2021)

A joint order-replacement policy for deteriorating components with reliability constraint. - Xiaosheng Si; Changhua Hu; Tianmei Li 001; Qi Zhang 035 (Sci. China Inf. Sci., 2021)

Optimal replacement of degrading components: a control-limit policy. - Xiaosheng Si; Tianmei Li 001; Qi Zhang 035 (Sci. China Inf. Sci., 2021)

An adaptive prognostics method for fusing CDBN and diffusion process: Application to bearing data. - Hong Pei; Xiao-Sheng Si; Chang-Hua Hu; Jian-Fei Zheng; Tianmei Li 001; Jianxun Zhang 001; Zhenan Pang (Neurocomputing, 2021)

Nonlinear degradation modeling and prognostics: A Box-Cox transformation perspective. - Xiao-Sheng Si; Tianmei Li 001; Jianxun Zhang 001; Yaguo Lei (Reliab. Eng. Syst. Saf., 2022)

Bayesian Deep-Learning-Based Prognostic Model for Equipment Without Label Data Related to Lifetime. - Hong Pei; Xiao-Sheng Si; Changhua Hu; Tianmei Li 001; Chuan He 003; Zhenan Pang (IEEE Trans. Syst. Man Cybern. Syst., 2023)

Prognosis for stochastic degrading systems with massive data: A data-model interactive perspective. - Tianmei Li 001; Hong Pei; Xiaosheng Si; Yaguo Lei (Reliab. Eng. Syst. Saf., 2023)

Remaining useful life prediction for stochastic degrading devices incorporating quantization. - Jian-Xun Zhang 001; Jia-Ling Zhang; Zheng-Xin Zhang; Tian-Mei Li 001; Xiao-Sheng Si (Reliab. Eng. Syst. Saf., 2024)

Interactive Prognosis Framework Between Deep Learning and a Stochastic Process Model for Remaining Useful Life Prediction. - Hong Pei; Xiaosheng Si; Tianmei Li 001; Zhengxin Zhang; Yaguo Lei (IEEE Trans. Neural Networks Learn. Syst., 2024)