Stress Evolution Analysis of EM-Induced Void Growth for Multi-Segment Interconnect Wires. - Zaiyong Liu; Hai-Bao Chen; Tianshu Hou (APCCAS, 2020)

Deeply Tensor Compressed Transformers for End-to-End Object Detection. - Peining Zhen; Ziyang Gao; Tianshu Hou; Yuan Cheng; Hai-Bao Chen (AAAI, 2022)

FASSST: Fast Attention Based Single-Stage Segmentation Net for Real-Time Instance Segmentation. - Yuan Cheng; Rui Lin; Peining Zhen; Tianshu Hou; Chiu Wa Ng; Hai-Bao Chen; Hao Yu 001; Ngai Wong 001 (WACV, 2022)

Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires. - Tianshu Hou; Peining Zhen; Ngai Wong 001; Quan Chen 007; Guoyong Shi; Shuqi Wang; Hai-Bao Chen (CoRR, 2022)

A Space-Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing. - Tianshu Hou; Ngai Wong 001; Quan Chen 007; Zhigang Ji; Hai-Bao Chen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

A Time- and Energy-Efficient CNN with Dense Connections on Memristor-Based Chips. - Wenyong Zhou; Yuan Ren; Jiajun Zhou; Tianshu Hou; Ngai Wong 001 (ASICON, 2023)

Multilayer Perceptron-Based Stress Evolution Analysis Under DC Current Stressing for Multisegment Wires. - Tianshu Hou; Peining Zhen; Ngai Wong 001; Quan Chen 007; Guoyong Shi; Shuqi Wang; Hai-Bao Chen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

Toward Compact Transformers for End-to-End Object Detection With Decomposed Chain Tensor Structure. - Peining Zhen; Xiaotao Yan; Wei Wang; Tianshu Hou; Hao Wei; Hai-Bao Chen (IEEE Trans. Circuits Syst. Video Technol., 2023)

A Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis. - Tianshu Hou; Peining Zhen; Zhigang Ji; Hai-Bao Chen (ACM Trans. Design Autom. Electr. Syst., 2023)

Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing. - Tianshu Hou; Ngai Wong 001; Quan Chen 007; Zhigang Ji; Hai-Bao Chen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

Physics-Informed Learning for Versatile RRAM Reset and Retention Simulation. - Tianshu Hou; Yuan Ren; Wenyong Zhou; Can Li; Zhongrui Wang; Hai-Bao Chen; Ngai Wong 001 (ASPDAC, 2024)

Physics-Informed Learning Based Multiphysics Simulation for Fast Transient TSV Electromigration Analysis. - Xiaoman Yang; Haibao Chen; Yuhan Zhang 005; Tianshu Hou; Pengpeng Ren; Runsheng Wang; Zhigang Ji; Ru Huang 001 (ACM Trans. Design Autom. Electr. Syst., 2025)