Open Set Industrial Surface Defect Recognition With High Frequency Feature Enhancement and Class Mutual-Information Constraint. - Zhen Yang 026; Tianyong Zheng; Xuefeng Ni; Zhi Yan 002; Shangzhi Liu; Yingtian Yu; Hong Chen; Yaonan Wang 001; Leyuan Fang; Wei Hao (IEEE Trans. Multim., 2026)

Open-IndDet: Advancing Open-Set Industrial Surface Defect Detection via Robust Class-Unique Feature Representation. - Zhen Yang 026; Tianyong Zheng; Xuefeng Ni; Zhi Yan 002; Hong Chen; Yaonan Wang 001; Leyuan Fang (IEEE Trans. Circuits Syst. Video Technol., 2026)