Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling. - Tidjani Garba-Seybou; Xavier Federspiel; Alain Bravaix; Florian Cacho (IRPS, 2021)

New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes. - Tidjani Garba-Seybou; Xavier Federspiel; Alain Bravaix; Florian Cacho (IRPS, 2022)

Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications. - Tidjani Garba-Seybou; Xavier Federspiel; Frederic Monsieur; Mathieu Sicre; Florian Cacho; Joycelyn Hai; Alain Bravaix (IRPS, 2023)

Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation. - Joycelyn Hai; Florian Cacho; X. Federspiel; Tidjani Garba-Seybou; A. Divay; Estelle Lauga-Larroze; Jean-Daniel Arnould (IRPS, 2023)