Performance and reliability improvement of flash device by a novel programming method. - Chia-Huai Ho; Kuei-Shu Chang-Liao; Ya-Nan Huang; Tien-Ko Wang; T. C. Lu (Microelectron. Reliab., 2007)

Employing vertical dielectric layers to improve the operation performance of flash memory devices. - Chia-Huai Ho; Kuei-Shu Chang-Liao; Chun-Yuan Lu; Chun-Chang Lu; Tien-Ko Wang (Microelectron. Reliab., 2009)

Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs. - Chun-Chang Lu; Kuei-Shu Chang-Liao; Chun-Yuan Lu; Shih-Cheng Chang; Tien-Ko Wang; Fu-Chung Hou; Yao-Tung Hsu (Microelectron. Reliab., 2011)