Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests. - Yi-Jun Lu; Ziquan Guo; Tien-Mo Shih; Yulin Gao; Wei-Lin Huang; Hong-Li Lu; Yue Lin 007; Zhong Chen 005 (IEEE Trans. Reliab., 2016)