Experience in HBM ESD testing of high pin count devices. - Tilo Brodbeck; Reinhold Gaertner (Microelectron. Reliab., 2007)

Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. - Viktor Dubec; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Tilo Brodbeck; Wolfgang Stadler (Microelectron. Reliab., 2007)

CDM tests on interface test chips for the verification of ESD protection concepts. - Tilo Brodbeck; Kai Esmark; Wolfgang Stadler (Microelectron. Reliab., 2009)

Reliability aspects of gate oxide under ESD pulse stress. - Adrien Ille; Wolfgang Stadler; Thomas Pompl; Harald Gossner; Tilo Brodbeck; Kai Esmark; Philipp Riess; David Alvarez; Kiran V. Chatty; Robert Gauthier 002; Alain Bravaix (Microelectron. Reliab., 2009)

Do ESD fails in systems correlate with IC ESD robustness? - Wolfgang Stadler; Tilo Brodbeck; Reinhold Gärtner; Harald Gossner (Microelectron. Reliab., 2009)