Weighted random test program generation for a per-pin tester. - Jeff Gartner; B. Driscoll; Donato O. Forlenza; Orazio P. Forlenza; Timothy J. Koprowski; T. Lizambri; R. Olsen; S. Robertson; P. Ryan; A. Walter (ITC, 1990)

Testing the 400-MHz IBM Generation-4 CMOS Chip. - Thomas G. Foote; Dale E. Hoffman; William V. Huott; Timothy J. Koprowski; Bryan J. Robbins; Mary P. Kusko (ITC, 1997)

Advanced microprocessor test strategy and methodology. - William V. Huott; Timothy J. Koprowski; Bryan J. Robbins; Mary P. Kusko; Stephen Pateras; Dale E. Hoffman; Timothy G. McNamara; Thomas J. Snethen (IBM J. Res. Dev., 1997)

Testing the 500-MHz IBM S/390 Microprocessor. - Thomas G. Foote; Dale E. Hoffman; William V. Huott; Timothy J. Koprowski; Mary P. Kusko; Bryan J. Robbins (IEEE Des. Test Comput., 1998)

99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor. - Mary P. Kusko; Bryan J. Robbins; Timothy J. Koprowski; William V. Huott (ITC, 2001)