Integrating Artificial Intelligence Models and Synthetic Image Data for Enhanced Asset Inspection and Defect Identification. - Reddy Mandati; Vladyslav Anderson; Po-Chen Chen; Ankush Agarwal; Tatjana Dokic; David Barnard; Michael Finn; Jesse Cromer; Andrew Mccauley; Clay Tutaj; Neha Dave; Bobby Besharati; et al. (CoRR, 2024)