Time-domain EMI measurement methodology. - Shih-Yi Yuan; Ting-Wei Yeh; Yung-Chi Tang; Chiu-Kuo Chen (EMC Compo, 2015)

Using Object Detection Technology to Measure the Accuracy of the TFT-LCD Printing Process by Using Deep Learning. - Ting-Wei Yeh; Fang-Yie Leu (EIDWT, 2021)