Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits. - Tino Heijmen (IOLTS, 2005)

Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. - Tino Heijmen; André Nieuwland (ETS, 2006)

Soft Error Rates in Deep-Submicron CMOS Technologies. - Tino Heijmen (IOLTS, 2006)

Factors That Impact the Critical Charge of Memory Elements. - Tino Heijmen; Damien Giot; Philippe Roche (IOLTS, 2006)

Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs. - Tino Heijmen (IOLTS, 2007)

Special Session 3 - Panel: SER in Automotive: what is the impact of the AEC Q100-G spec? - Tino Heijmen (IOLTS, 2008)

Soft-Error Vulnerability of Sub-100-nm Flip-Flops. - Tino Heijmen (IOLTS, 2008)