Optimal Fault Detection for Closed-Loop Linear Uncertain Systems. - Koen Classens; Tjeerd Ickenroth; Jeroen van de Wijdeven; W. P. Maurice H. Heemels; Tom Oomen (CDC, 2024)

Automatic Basis Function Selection in Iterative Learning Control: A Sparsity-Promoting Approach Applied to an Industrial Printer. - Tjeerd Ickenroth; Max van Haren; Johan Kon; Max van Meer; Jilles van Hulst; Tom Oomen (ACC, 2025)