The measurement of the dielectric and optical properties of nano thin films by THz differential time-domain spectroscopy. - Kwang-Su Lee; Toh-Ming Lu; Xicheng Zhang (Microelectron. J., 2003)

Study of metal adhesion on porous low-k dielectric using telephone cord buckling. - Ming He; C. Gaire; G.-C. Wang; Toh-Ming Lu (Microelectron. Reliab., 2011)

Bias-temperature stress of Al on porous low-k dielectrics. - Ming He; Huafang Li; Pei-I Wang; Toh-Ming Lu (Microelectron. Reliab., 2011)

A moisture-related breakdown mechanism in low-k dielectrics using a multiple I-V ramp test. - Sean P. Ogden; Juan Borja; Huawei Zhou; Joel L. Plawsky; Toh-Ming Lu; William N. Gill (IRPS, 2015)

Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness. - Sean P. Ogden; Yueming Xu; Kong Boon Yeap; Tian Shen; Toh-Ming Lu; Joel L. Plawsky (Microelectron. Reliab., 2018)