A Review of Knowledge-Based Defect Identification via PRPD Patterns in High Voltage Apparatus. - Tohid Shahsavarian; Yue Pan; Zhousheng Zhang; Cheng Pan; Hadi Naderiallaf; Jim Guo; Chuanyang Li; Yang Cao (IEEE Access, 2021)

Electrical Treeing at High Altitude: Effect of Pressure and Temperature. - Kerry Lynn Davis-Amendola; Mohamadreza Arab Baferani; Tohid Shahsavarian; Chuanyang Li; Wesley W. Zhong; Joanne Ronzello; Roger C. Walker; Yang Cao (IEEE Access, 2024)

Unveiling Insights Into Partial Discharge and Design and Encapsulation Challenges in DCB-Based Power Converters for Aerospace Applications. - Tohid Shahsavarian; Moritz Ploner; Kerry Lynn Davis-Amendola; Brian Chislea; John McKeen; Di Zhang; Andrea Cavallini 002; Yang Cao (IEEE Access, 2024)

DC Flashover in Printed Circuit Boards at Low Gas Pressures: Mechanism and Mitigation Recommendations. - Jierui Zhou; Mohamadreza Arab Baferani; Tohid Shahsavarian; Patrick McGinnis; Steven Walker; Dehao Qin; Zheyu Zhang; Dong Dong; Di Zhang; Chuanyang Li; Yang Cao (IEEE Access, 2024)