Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected VLSI Designs. - Valery Axelrad; Nicolas B. Cobb; M. O'Brien; Thuy Do; Tom Donnelly; Yuri Granik; Emile Y. Sahouria; Victor Boksha; Artur Balasinski (ISQED, 2000)

Denoising and decoding spontaneous vagus nerve recordings with machine learning. - Mafalda Ribeiro; Ryan G. L. Koh; Tom Donnelly; Christof Lutteroth; Michael J. Proulx; Paulo R. F. Rocha; Benjamin Metcalfe (EMBC, 2023)

Automatic text classification of drug-induced liver injury using document-term matrix and XGBoost. - Minjun Chen; Yue Wu; Byron Wingerd; Zhichao Liu; Joshua Xu; Shraddha Thakkar; Thomas J. Pedersen; Tom Donnelly; Nicholas Mann; Weida Tong; Russell D. Wolfinger; Wenjun Bao (Frontiers Artif. Intell., 2024)