A Two-Level Guidance Heuristic for ATPG. - Tom E. Kirkland; M. Ray Mercer (FJCC, 1986)

A Topological Search Algorithm for ATPG. - Tom E. Kirkland; M. Ray Mercer (DAC, 1987)

Algorithms for automatic test pattern generation. - Tom E. Kirkland; M. Ray Mercer (IEEE Des. Test, 1988)

Logic design verification via test generation. - Magdy S. Abadir; Jack Ferguson; Tom E. Kirkland (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)