Building-in reliability in BCD (Bipolar-CMOS-DMOS) technologies. - Jifa Hao; T. E. Kopley (ASICON, 2013)

Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs. - Amartya Ghosh; Jifa Hao; Michael Cook 004; Chris Kendrick; Samia A. Suliman; Gavin D. R. Hall; Tom Kopley; Osama O. Awadelkarim (IRPS, 2020)