Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. - Changsoo Hong; Linda S. Milor; Munkang Choi; Tom Lin (Microelectron. Reliab., 2005)

Tracking Performance Portability on the Yellow Brick Road to Exascale. - Tom Deakin; Andrei Poenaru; Tom Lin; Simon McIntosh-Smith (P3HPC@SC, 2020)