Countable Structures, Ehrenfeucht Stratagies, and Wadge Reductions. - Tom Linton (J. Symb. Log., 1991)

Effect of trench edge on pMOSFET reliability. - Yung-Huei Lee; Tom Linton; Ken Wu; Neal R. Mielke (Microelectron. Reliab., 2001)

Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. - Ali Keshavarzi; Gerhard Schrom; Stephen Tang; Sean Ma; Keith A. Bowman; Sunit Tyagi; Kevin Zhang 001; Tom Linton; Nagib Hakim; Steven G. Duvall; John Brews; Vivek De (ISLPED, 2005)